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Can't examine high-cycle data flash on STM32H573
#7
I finally got around creating a test configuration.
I uploaded it to Github Test Project.

In main.c are two defines for enabling the two tests. I would recommend starting off with only TEST2 enabled. I would suggest to only try TEST1 once TEST2 is working.

TEST1 is for checking if data can be directly linked into high-cycle memory. This was not my original issue, but I think writing to high cycle flash is just as important as reading. But I found out that this doesnt work with STLink debugger, either. But it probably is a bug there, too.

TEST2 is testing for my original issue, this works with STLink debugger.

I have described more in the projects README.md about how to perform the tests.

I also use my flash functions for interaction with high-cycle flash inside flash.c. We can probably copy from them when upgrading the eblink flash functionality for high-cycle memory.

One important note for debugging is, that reading from virgin flash causes a double ECC error and thus a currently unhandled NMI. So debugger watches on addresses in high cycle flash are probably a bad idea.
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Messages In This Thread
RE: Can't examine high-cycle flash - by embitz - 23-09-2024, 09:17 AM
RE: Can't examine high-cycle flash - by dliebler - 26-09-2024, 03:10 PM
RE: Can't examine high-cycle flash - by embitz - 03-10-2024, 08:33 AM
RE: Can't examine high-cycle data flash on STM32H573 - by dliebler - 24-10-2024, 10:12 AM

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