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Examine high-cycle flash STM32H573 [solved]
#12
I will look into it. I have only one H5 board so I can not test the smaller devices.

_n_throw is a build-in script function:
Code:
_n_throw(v) {
  if( v < 0)  throw(v)
}


EBlink uses negative numbers for errors and -1 (ERROR_NOTIFIED) is reserved for errors that have already been reported to the user.

Is it sure that all those devices are using the same address to report flash size?

Yes, I would like to keep everything in one file. We now also check if HC is enabled and otherwise we skip it in the memory map because the length of those sections are zero.

BTW
I released EBlink 5.30 with a lot of fixes (increased bandwidth/speed)
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Messages In This Thread
RE: Can't examine high-cycle flash - by embitz - 23-09-2024, 09:17 AM
RE: Can't examine high-cycle flash - by dliebler - 26-09-2024, 03:10 PM
RE: Can't examine high-cycle flash - by embitz - 03-10-2024, 08:33 AM
RE: Can't examine high-cycle data flash on STM32H573 - by embitz - 14-11-2024, 08:28 PM

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